Random telegraph signal noise in gate-all-around silicon nanowire transistors featuring Coulomb-blockade characteristics

✍ Scribed by Zhuge, Jing; Zhang, Liangliang; Wang, Runsheng; Huang, Ru; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan

• Book ID: 120399284
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 600 KB
• Volume: 94
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3089240