✦ LIBER ✦
Investigation of gate-all-around silicon nanowire transistors for ultimately scaled CMOS technology from top-down approach
✍ Scribed by Huang, Ru ;Wang, Run-sheng
- Book ID
- 113083743
- Publisher
- Higher Education Press and Springer
- Year
- 2010
- Tongue
- English
- Weight
- 500 KB
- Volume
- 5
- Category
- Article
- ISSN
- 1673-3487
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