✦ LIBER ✦

IIIB-1 degradation of 77-K MOSFET characteristics due to channel hot electrons

✍ Scribed by Sun, J.Y.C.; Wordeman, M.R.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Modeling of hot-electron-induced charact

✍ H. Wong; Y.C. Cheng 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 641 KB

Analysis of MOSFET degradation due to ho

✍ Sunil Shabde; Anjan Bhattacharyya; Ron S. Kao; Richard S. Muller 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 725 KB

IVB-1 degradation of I-V characteristics

✍ Ng, K.K.; Taylor, G.W. 📂 Article 📅 1981 🏛 IEEE 🌐 English ⚖ 183 KB

Change in Transfer and Low-Frequency Noi

✍ A. Hatzopoulos; N. Archontas; N. Hastas; C. Dimitriadis; G. Kamarinos; N. Georgo 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 145 KB

Modelling the local damage of short-chan

✍ Januschewski, F. ;Erzgräber, H. J. ;Füssel, W. 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 298 KB

Degradation of 1/f noise in short channe

✍ A.K.M. Ahsan; Shaikh Ahmed 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 228 KB