✦ LIBER ✦
Degradation of 1/f noise in short channel MOSFETs due to halo angle induced VT non-uniformity and extra trap states at interface
✍ Scribed by A.K.M. Ahsan; Shaikh Ahmed
- Book ID
- 108271537
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 228 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0038-1101
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