Analysis of MOSFET degradation due to hot-electron stress in terms of interface-state and fixed-charge generation

✍ Scribed by Sunil Shabde; Anjan Bhattacharyya; Ron S. Kao; Richard S. Muller

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 725 KB
• Volume: 31
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(88)90007-x