Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation

✍ Scribed by A. Hatzopoulos; N. Archontas; N. Hastas; C. Dimitriadis; G. Kamarinos; N. Georgoulas; A. Thanailakis

• Book ID: 126596894
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 145 KB
• Volume: 25
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2004.828555