IVB-1 degradation of I-V characteristics due to the drain-gate-substrate interaction in MOSFETs

✍ Scribed by Ng, K.K.; Taylor, G.W.

• Book ID: 114593914
• Publisher: IEEE
• Year: 1981
• Tongue: English
• Weight: 183 KB
• Volume: 28
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1981.20558