✦ LIBER ✦
Modelling the local damage of short-channel MOSFETs due to hot electron injection using results from photoinjection measurements on MOS capacitors
✍ Scribed by Januschewski, F. ;Erzgräber, H. J. ;Füssel, W.
- Book ID
- 105380527
- Publisher
- John Wiley and Sons
- Year
- 1988
- Tongue
- English
- Weight
- 298 KB
- Volume
- 106
- Category
- Article
- ISSN
- 0031-8965
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