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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - A comparative study of charge trapping effects in LDD surface-channel and buried-channel pMOS transistors using charge profiling and threshold voltage shift measurements

✍ Scribed by Kok, C.K.; Chew, W.C.; Chim, W.K.; Chan, D.S.H.; Leang, S.E.

Book ID: 126596863
Publisher: IEEE
Year: 1999
Weight: 629 KB
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/IPFA.1999.791334

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