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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Impact of failure criteria on electromigration of W-plug contact

✍ Scribed by Guo Qiang, ; Lo Keng Foo, ; Zeng Xu, ; Liu Xu, ; Yao Pei, ; Tan Pee Ya,

Book ID: 126765391
Publisher: IEEE
Year: 1999
Weight: 419 KB
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/IPFA.1999.791319

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