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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Characterization and application of highly sensitive infra-red emission microscopy for microprocessor backside failure analysis

✍ Scribed by Loh Ter Hoe, ; Yee Wai Mun, ; Chew Yin Yan,

Book ID: 126622635
Publisher: IEEE
Year: 1999
Weight: 598 KB
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/IPFA.1999.791316

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