𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Novel backside sample preparation processes for advanced CMOS integrated circuits failure analysis

✍ Scribed by Chew, Y.Y.; Siek, K.H.; Yee, W.M.

Book ID: 115449431
Publisher: IEEE
Year: 1999
Weight: 429 KB
Volume: 0
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/ipfa.1999.791318

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Impact of failure criteria on electromigration of W-plug contact

✍ Guo Qiang, ; Lo Keng Foo, ; Zeng Xu, ; Liu Xu, ; Yao Pei, ; Tan Pee Ya, 📂 Article 📅 1999 🏛 IEEE ⚖ 419 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Characterization and application of highly sensitive infra-red emission microscopy for microprocessor backside failure analysis

✍ Loh Ter Hoe, ; Yee Wai Mun, ; Chew Yin Yan, 📂 Article 📅 1999 🏛 IEEE ⚖ 598 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - An empirical breakdown model of the gate oxide under current stress

✍ Jin-Ho Seo, ; Woo, J.C.S. 📂 Article 📅 1999 🏛 IEEE ⚖ 350 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - A latch-up immunized lateral trench-gate conductivity modulated power transistor

✍ Jun Cai, ; Keng Foo Lo, ; Sin, J.K.O. 📂 Article 📅 1999 🏛 IEEE ⚖ 430 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Laser voltage probe (LVP): a novel optical probing technology for flip-chip packaged microprocessors

✍ Wai Mun Yee, ; Paniccia, M.; Eiles, T.; Rao, V. 📂 Article 📅 1999 🏛 IEEE ⚖ 559 KB

[IEEE Proceedings of the 1999 7th Intern

[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Identification of processing defects by focused ion beam (FIB) induced voltage contrast

✍ Chun-Sheng Liu, ; Chih-Rong Chen, ; Yong-Fen Hsieh, 📂 Article 📅 1999 🏛 IEEE ⚖ 631 KB