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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Identification of processing defects by focused ion beam (FIB) induced voltage contrast

✍ Scribed by Chun-Sheng Liu, ; Chih-Rong Chen, ; Yong-Fen Hsieh,

Book ID: 126629503
Publisher: IEEE
Year: 1999
Weight: 631 KB
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/IPFA.1999.791320

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