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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Long term noise measurements to characterize electromigration in metal lines of ICs

✍ Scribed by Ciofi, C.; Dattilo, V.; Neri, B.; Foley, S.; Mathewson, A.

Book ID: 126616700
Publisher: IEEE
Year: 1999
Weight: 453 KB
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/IPFA.1999.791321

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