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[IEEE Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Singapore (1999.07.9-1999.07.9)] Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394) - Temperature distribution in power GaAs field effect transistors using spatially resolved photoluminescence mapping

✍ Scribed by Landesman, J.P.; Martin, E.; Braun, P.

Book ID: 118274166
Publisher: IEEE
Year: 1999
Weight: 561 KB
Volume: 0
Category: Article
ISBN-13: 9780780351875
DOI: 10.1109/ipfa.1999.791331

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