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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Universal surfaces for the accurate contact resistivity extraction on Kelvin structures with upper and lower resistive layers

✍ Scribed by Santander, J.; Lozano, M.; Gotz, A.; Cane, C.; Lora-Tamayo, E.

Book ID: 126665169
Publisher: IEEE
Year: 1996
Weight: 634 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535623

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