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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - A new test structure methodology for MOS hot carrier reliability

✍ Scribed by Lee, M.

Book ID: 126645105
Publisher: IEEE
Year: 1996
Weight: 434 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535657

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