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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - A test chip for the development of PIN-type silicon radiation detectors

✍ Scribed by Dalla Betta, G.F.; Boscardin, M.; Verzellesi, G.; Pignatel, G.U.; Fazzi, A.; Soncini, G.

Book ID: 127126108
Publisher: IEEE
Year: 1996
Weight: 597 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/icmts.1996.535652

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