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[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - Spatial distribution of recombination centers in electron irradiated silicon epitaxial layers

✍ Scribed by Daliento, S.; Sanseverino, A.; Spirito, P.; Zeni, L.

Book ID: 126651988
Publisher: IEEE
Year: 1996
Weight: 314 KB
Category: Article
ISBN-13: 9780780327832
DOI: 10.1109/ICMTS.1996.535639

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