𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Use of SPIDER for the identification and analysis of process induced damage in 0.35 μm transistors

✍ Scribed by Aum, P.; Xiaoyu Li, ; Prabhakar, V.; Brozek, T.; Viswanathan, C.R.

Book ID: 126751438
Publisher: IEEE
Year: 1995
Weight: 365 KB
Category: Article
ISBN-13: 9780780320659
DOI: 10.1109/ICMTS.1995.513935

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Mismatch characterization of small size MOS transistors

✍ Bastos, J.; Steyaert, M.; Roovers, R.; Kinget, P.; Sansen, W.; Graindourze, B.; 📂 Article 📅 1995 🏛 IEEE ⚖ 677 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Gate antenna structures for monitoring oxide quality and reliability

✍ Nariani, S.R.; Gabriel, C.T.; Pramanik, D.; Ng, K. 📂 Article 📅 1995 🏛 IEEE ⚖ 270 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Depth measurements using alpha particles and upsetable SRAMs

✍ Buehler, M.G.; Reier, M.; Soli, G.A. 📂 Article 📅 1995 🏛 IEEE ⚖ 467 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Characterization and modeling of MOS mismatch in analog CMOS technology

✍ Shyh-Chyi Wong, ; Jyh-Kang Ting, ; Shun-Liang Hsu, 📂 Article 📅 1995 🏛 IEEE ⚖ 467 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - Determination of solid solubility limit of In and Sb in Si using bonded silicon-on-insulator (SOI) substrate

✍ Sato, A.; Suzuki, K.; Horie, H.; Sugii, T. 📂 Article 📅 1995 🏛 IEEE ⚖ 246 KB

[IEEE International Conference on Microe

[IEEE International Conference on Microelectronic Test Structures - Nara, Japan (22-25 March 1995)] Proceedings International Conference on Microelectronic Test Structures - United methodology for pre-determination of bipolar transistor SPICE model parameters for low, middle and high power ICs

✍ Petrosjanc, K.O.; Kharitonov, I.A.; Rjabov, N.I. 📂 Article 📅 1995 🏛 IEEE ⚖ 452 KB