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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Manufacturable embedded CMOS 6T-SRAM technology with high-k gate dielectric device for system-on-chip applications

✍ Scribed by Oh, C.B.; Kang, H.S.; Ryu, H.J.; Oh, M.H.; Jung, H.S.; Kim, Y.S.; He, J.H.; Lee, N.I.; Cho, K.H.; Lee, D.H.; Yang, T.H.; Cho, I.S.; Kang, H.K.; Kim, Y.W.; Suh, K.P.

Book ID: 120298899
Publisher: IEEE
Year: 2002
Weight: 301 KB
Category: Article
ISBN-13: 9780780374621
DOI: 10.1109/IEDM.2002.1175869

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