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[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - High performance 30 nm bulk CMOS for 65 nm technology node (CMOS5)

✍ Scribed by Morifuji, E.; Kanda, M.; Yanagiya, N.; Matsuda, S.; Inaba, S.; Okano, K.; Takahashi, K.; Nishigori, M.; Tsuno, H.; Yamamoto, T.; Hiyama, K.; Takayanagi, M.; Oyamatsu, H.; Yamada, S.; Noguchi, T.; Kakumu, M.

Book ID: 120589190
Publisher: IEEE
Year: 2002
Weight: 206 KB
Category: Article
ISBN-13: 9780780374621
DOI: 10.1109/IEDM.2002.1175924

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