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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - A robust alternative for the DRAM capacitor of 50nm generation

✍ Scribed by Kwang Hee Lee, ; Suk-Jin Chung, ; Jin Yong Kim, ; Ki-Chul Kim, ; Jae-Soon Lim, ; Kyuho Cho, ; Jinil Lee, ; Jeong-Hee Chung, ; Hanjin Lim, ; Kyungln Choi, ; Sangho Han, ; Soolk Jang, ; Byeong-Yun Nam, ; Cha-Young Yoo, ; Sung-The Yim, ; U-In Chung, ; Joo-Tae Moon, ; Byung-Il Ryu,

Book ID: 126732145
Publisher: IEEE
Year: 2004
Weight: 241 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419308

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