𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Challenges for the integration of metal gate electrodes

✍ Scribed by Schaeffer, J.K.; Capasso, C.; Fonseca, L.R.C.; Samavedam, S.; Gilmer, D.C.; Liang, Y.; Kalpat, S.; Adetutu, B.; Tseng, H.-H.; Shiho, Y.; Demkov, A.; Hegde, R.; Taylor, W.J.; Gregory, R.; Jiang, J.; Luckowski, E.; Raymond, M.V.; Moore, K.; Triyoso, D.; Roan, D.; White, B.E.; Tobin, P.J.

Book ID: 126662218
Publisher: IEEE
Year: 2004
Weight: 251 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419135

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 3.3 ps SiGe bipolar technology

✍ Bock, J.; Schafer, H.; Knapp, H.; Aufinger, K.; Wurzer, M.; Boguth, S.; Bottner, 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 212 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Spintronic materials and devices: past, present and future!

✍ Parkin, S.S.P. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 294 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Lateral IMPATT diodes in standard CMOS technology

✍ Al-Attar, T.; Mulligan, M.D.; Lee, T.H. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 191 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Status and outlook of emerging nonvolatile memory technologies

✍ Muller, G.; Happ, T.; Kund, M.; Lee, G.Y.; Nagel, N.; Sezi, R. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 257 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Novel carbon nanotube FET design with tunable polarity

✍ Yu-Ming Lin, ; Appenzeller, J.; Avouris, P. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 261 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 100nm InAlAs/InGaAs double-gate HEMT using transferred substrate

✍ N. Wichmann, I. Duszynski 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 266 KB