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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 3.3 ps SiGe bipolar technology

✍ Scribed by Bock, J.; Schafer, H.; Knapp, H.; Aufinger, K.; Wurzer, M.; Boguth, S.; Bottner, T.; Stengl, R.; Perndl, W.; Meister, T.F.

Book ID: 120833213
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 212 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419124

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