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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Record RF performance of standard 90 nm CMOS technology

✍ Scribed by Tirmejer, L.F.; Havens, R.J.; de Kort, R.; Scholten, A.J.; van Langevelde, R.; Klaassen, D.B.M.; Sasse, G.T.; Bouttement, Y.; Petot, C.; Bardy, S.; Gloria, D.; Scheer, P.; Boret, S.; Van Haaren, B.; Clement, C.; Larchanche, J-F.; Lim, I.-S.; Zlotnicka, A.; Duvallet, A.

Book ID: 124101107
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 249 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419181

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