𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 100nm InAlAs/InGaAs double-gate HEMT using transferred substrate

✍ Scribed by N. Wichmann, I. Duszynski

Book ID: 121340542
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 266 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/IEDM.2004.1419364

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 3.3 ps SiGe bipolar technology

✍ Bock, J.; Schafer, H.; Knapp, H.; Aufinger, K.; Wurzer, M.; Boguth, S.; Bottner, 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 212 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Challenges for the integration of metal gate electrodes

✍ Schaeffer, J.K.; Capasso, C.; Fonseca, L.R.C.; Samavedam, S.; Gilmer, D.C.; Lian 📂 Article 📅 2004 🏛 IEEE ⚖ 251 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Spintronic materials and devices: past, present and future!

✍ Parkin, S.S.P. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 294 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Lateral IMPATT diodes in standard CMOS technology

✍ Al-Attar, T.; Mulligan, M.D.; Lee, T.H. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 191 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Record RF performance of standard 90 nm CMOS technology

✍ Tirmejer, L.F.; Havens, R.J.; de Kort, R.; Scholten, A.J.; van Langevelde, R.; K 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 249 KB

[IEEE IEDM Technical Digest. IEEE Intern

[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Status and outlook of emerging nonvolatile memory technologies

✍ Muller, G.; Happ, T.; Kund, M.; Lee, G.Y.; Nagel, N.; Sezi, R. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 257 KB