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[IEEE ICMTS 93 1993 International Conference on Microelectronic Test Structures - Sitges, Spain (22-25 March 1993)] ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures - Direct extraction of SPICE level 3 parameters without using optimization

✍ Scribed by Matsuda, J.-i.

Book ID: 120826206
Publisher: IEEE
Year: 1992
Weight: 445 KB
Category: Article
ISBN-13: 9780780308572
DOI: 10.1109/ICMTS.1993.292902

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