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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A novel method for base and emitter resistance extraction in bipolar junction transistors from static and low frequency noise measurements

✍ Scribed by Llinares, P.; Ghibaudo, G.; Gambetta, N.; Mourier, Y.; Monroy, A.; Lecoy, G.; Chroboczek, J.A.

Book ID: 126734308
Publisher: IEEE
Year: 1998
Weight: 307 KB
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/ICMTS.1998.688043

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