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[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Measurement of '1/f' noise in narrow poly-silicon emitter bipolar transistor structures

✍ Scribed by Connor, S.D.

Book ID: 126699232
Publisher: IEEE
Year: 1998
Weight: 471 KB
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/ICMTS.1998.688060

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