𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A prediction method of oxide breakdown caused by defects in SiO/sub 2/ films

✍ Scribed by Uchida, H.; Hirashita, N.

Book ID: 126694353
Publisher: IEEE
Year: 1998
Weight: 340 KB
Category: Article
ISBN-13: 9780780343481
DOI: 10.1109/ICMTS.1998.688062

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Characterization and application of interconnect process parameters

✍ Chou, A.; Chang, K.-J.; Mathews, R.; Wong, K.; Wang, T.; Wei, Y.-H.; Su, K.C.; H 📂 Article 📅 1998 🏛 IEEE ⚖ 333 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Benchmark methodology of interconnect capacitance simulation using inter-digitated capacitors

✍ Nakagawa, O.S.; Oh, S.-Y.; Hsu, T.; Habu, S. 📂 Article 📅 1998 🏛 IEEE ⚖ 267 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A high density integrated test matrix of MOS transistors for matching study

✍ Portmann, L.; Lallement, C.; Krummenacher, F. 📂 Article 📅 1998 🏛 IEEE ⚖ 935 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Anomalous geometry dependence of source/drain resistance in narrow-width MOSFETs

✍ Scholten, A.J.; Klaassen, D.B.M. 📂 Article 📅 1998 🏛 IEEE ⚖ 503 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - Study of low frequency noise in scaled down silicon CMOS transistors

✍ Boutchacha, T.; Ghibaudo, G.; Blmekki, B. 📂 Article 📅 1998 🏛 IEEE ⚖ 35 KB

[IEEE ICMTS 1998. International Conferen

[IEEE ICMTS 1998. International Conference on Microelectronic Test Structures - Kanazawa, Japan (23-26 March 1998)] ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) - A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters

✍ Ingvarson, F.; Jeppson, K.O. 📂 Article 📅 1998 🏛 IEEE ⚖ 663 KB