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[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - March SS: a test for all static simple RAM faults

✍ Scribed by Hamdioui, S.; van de Goor, A.J.; Rodgers, M.

Book ID: 120603715
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 306 KB
Category: Article
ISBN-13: 9780769516172
DOI: 10.1109/MTDT.2002.1029769

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