𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Coding scheme for low energy consumption fault-tolerant bus

✍ Scribed by Rossi, D.; van Dijk, V.E.S.; Kleihorst, R.P.; Nieuwland, A.H.; Metra, C.

Book ID: 118192273
Publisher: IEEE
Year: 2002
Weight: 301 KB
Volume: 0
Category: Article
ISBN-13: 9780769516417
DOI: 10.1109/olt.2002.1030176

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Eighth IEEE International On-Line

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A low power pseudo-random BIST technique

✍ Basturkmen, N.Z.; Reddy, S.M.; Pomeranz, I. 📂 Article 📅 2002 🏛 IEEE ⚖ 346 KB

[IEEE Eighth IEEE International On-Line

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - An architecture for self-healing digital systems

✍ Lala, P.K.; Kumar, B.K. 📂 Article 📅 2002 🏛 IEEE ⚖ 222 KB

[IEEE Eighth IEEE International On-Line

[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques

✍ Appello, D.; Fudoli, A.; Tancorre, V.; Corno, F.; Rebaudengo, M.; Sonza Reorda, 📂 Article 📅 2002 🏛 IEEE ⚖ 361 KB

[IEEE Comput. Soc Records of the 2002 IE

[IEEE Comput. Soc Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing - Isle of Bendor, France (10-12 July 2002)] Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002) - March SS: a test for all static simple RAM faults

✍ Hamdioui, S.; van de Goor, A.J.; Rodgers, M. 📂 Article 📅 2002 🏛 IEEE Comput. Soc 🌐 English ⚖ 306 KB