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[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A BIST-based solution for the diagnosis of embedded memories adopting image processing techniques

✍ Scribed by Appello, D.; Fudoli, A.; Tancorre, V.; Corno, F.; Rebaudengo, M.; Sonza Reorda, M.

Book ID: 120578681
Publisher: IEEE
Year: 2002
Weight: 361 KB
Category: Article
ISBN-13: 9780769516417
DOI: 10.1109/OLT.2002.1030220

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