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[IEEE Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - Isle of Bendor, France (8-10 July 2002)] Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) - A low power pseudo-random BIST technique

✍ Scribed by Basturkmen, N.Z.; Reddy, S.M.; Pomeranz, I.

Book ID: 120997135
Publisher: IEEE
Year: 2002
Weight: 346 KB
Category: Article
ISBN-13: 9780769516417
DOI: 10.1109/OLT.2002.1030197

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