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[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Accurate yield estimation of circuits with redundancy

โœ Scribed by Gaitonde, D.D.; Walker, D.M.H.; Maly, W.


Book ID
126730488
Publisher
IEEE Comput. Soc. Press
Year
1995
Weight
549 KB
Category
Article
ISBN-13
9780818671074

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