𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Accurate yield estimation of circuits with redundancy

✍ Scribed by Gaitonde, D.D.; Walker, D.M.H.; Maly, W.

Book ID: 126730488
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 549 KB
Category: Article
ISBN-13: 9780818671074
DOI: 10.1109/DFTVS.1995.476948

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press International W

[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Layer assignment for yield enhancement

✍ Zhan Chen, ; Koren, I. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 433 KB

[IEEE Comput. Soc. Press International W

[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Novel Berger code checker

✍ Metra, C.; Favalli, M.; Ricco, B. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 477 KB

[IEEE Comput. Soc. Press International W

[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Efficient algorithms for analyzing and synthesizing fault-tolerant datapaths

✍ Narasimhan, R.; Rosenkrantz, D.J.; Ravi, S.S. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 565 KB

[IEEE Comput. Soc. Press International W

[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Constructions of the SbEC-DbED and DbEC codes, and their applications

✍ Feng, G.L.; Sihai Xiao, ; Xiaofa Shi, ; Rao, T.R.N. 📂 Article 📅 1995 🏛 IEEE Comput. Soc. Press ⚖ 431 KB

[IEEE Comput. Soc. Press 1992 IEEE Inter

[IEEE Comput. Soc. Press 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Dallas, TX, USA (4-6 Nov. 1992)] Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Time redundant error correcting adders and multipliers

✍ Hsu, Y.M.; Swartzlander, E.E. 📂 Article 📅 1992 🏛 IEEE Comput. Soc. Press ⚖ 329 KB

[IEEE Comput. Soc. Press 1992 IEEE Inter

[IEEE Comput. Soc. Press 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Dallas, TX, USA (4-6 Nov. 1992)] Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Time complexity of systolic array testing

✍ Faroughi, N. 📂 Article 📅 1992 🏛 IEEE Comput. Soc. Press ⚖ 320 KB