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[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Layer assignment for yield enhancement

✍ Scribed by Zhan Chen, ; Koren, I.

Book ID: 126697611
Publisher: IEEE Comput. Soc. Press
Year: 1995
Weight: 433 KB
Category: Article
ISBN-13: 9780818671074
DOI: 10.1109/DFTVS.1995.476950

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