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[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Constructions of the SbEC-DbED and DbEC codes, and their applications

โœ Scribed by Feng, G.L.; Sihai Xiao, ; Xiaofa Shi, ; Rao, T.R.N.


Book ID
126601200
Publisher
IEEE Comput. Soc. Press
Year
1995
Weight
431 KB
Category
Article
ISBN-13
9780818671074

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