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[IEEE Comput. Soc. Press International Workshop on Defect and Fault Tolerance in VLSI - Lafayette, LA, USA (13-15 Nov. 1995)] Proceedings of International Workshop on Defect and Fault Tolerance in VLSI - Efficient algorithms for analyzing and synthesizing fault-tolerant datapaths

โœ Scribed by Narasimhan, R.; Rosenkrantz, D.J.; Ravi, S.S.


Book ID
126694289
Publisher
IEEE Comput. Soc. Press
Year
1995
Weight
565 KB
Category
Article
ISBN-13
9780818671074

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