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[IEEE Comput. Soc. Press 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Dallas, TX, USA (4-6 Nov. 1992)] Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems - Time complexity of systolic array testing

✍ Scribed by Faroughi, N.

Book ID: 120655998
Publisher: IEEE Comput. Soc. Press
Year: 1992
Weight: 320 KB
Category: Article
ISBN-13: 9780818628375
DOI: 10.1109/DFTVS.1992.224373

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