𝔖 Bobbio Scriptorium

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[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - Soft-error detection through software fault-tolerance techniques

✍ Scribed by Rebaudengo, M.; Sonza Reorda, M.; Torchiano, M.; Violante, M.

Book ID: 120815081
Publisher: IEEE Comput. Soc
Year: 1999
Tongue: English
Weight: 56 KB
Category: Article
ISBN-13: 9780769503257
DOI: 10.1109/DFTVS.1999.802887

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