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[IEEE Comput. Soc 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Albuquerque, NM, USA (1-3 Nov. 1999)] Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) - 8-bit multiplier simulation experiments investigating the use of power supply transient signals for the detection of CMOS defects

✍ Scribed by Plusquellic, J.F.; Germida, A.; Yan, Z.

Book ID: 125490996
Publisher: IEEE Comput. Soc
Year: 1999
Tongue: English
Weight: 152 KB
Category: Article
ISBN-13: 9780769503257
DOI: 10.1109/DFTVS.1999.802871

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📜 SIMILAR VOLUMES

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