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[IEEE Comput. Soc 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - San Francisco, CA, USA (24-26 Oct. 2001)] Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Development of the special software tools for the defect/fault analysis in the complex gates from standard cell library

โœ Scribed by Blyzniuk, M.; Kazymyra, I.

Book ID
126748092
Publisher
IEEE Comput. Soc
Year
2001
Weight
538 KB
Category
Article
ISBN-13
9780769512037

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