[IEEE Comput. Soc 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - San Francisco, CA, USA (24-26 Oct. 2001)] Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Fast run-time fault location in dependable FPGA-based applications
โ Scribed by Wei-Je Huang, ; Mitra, S.; McCluskey, E.J.
- Book ID
- 126680216
- Publisher
- IEEE Comput. Soc
- Year
- 2001
- Tongue
- English
- Weight
- 156 KB
- Category
- Article
- ISBN-13
- 9780769512037
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โฆ Synopsis
Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and failsafe circuits, and fault-tolerant techniques. An abstract accompanies each paper. Contributors are primarily computer scientists and electrical engineers. Indexed by author only (not by subject). Annotation c. Book News, Inc., Portland, OR (booknews.com)
๐ SIMILAR VOLUMES
Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and f
Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and f
Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and f
Taken from the October 2001 San Francisco conference, 55 papers discuss water scale, yield, dependable design, testing techniques, fault-tolerance in arrays, fault detection, FPGA based applications, fault injection, error correcting codes, mixed signal circuits, defect analysis, self-checking and f