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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Concurrent error detection of polynomial basis multiplication over extension fields using a multiple-bit parity scheme

✍ Scribed by Bayat-Sarmadi, S.; Hasan, M.A.

Book ID: 118255323
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 312 KB
Volume: 0
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/dftvs.2005.24

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