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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Soft error modeling and protection for sequential elements

โœ Scribed by Asadi, H.; Tahoori, M.B.


Book ID
115524858
Publisher
IEEE Comput. Soc
Year
2005
Weight
258 KB
Volume
0
Category
Article
ISBN-13
9780769524641

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