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[IEEE Comput. Soc 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Monterey, CA, USA (3-5 Oct. 2005)] 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Soft error modeling and protection for sequential elements

✍ Scribed by Asadi, H.; Tahoori, M.B.

Book ID: 115524858
Publisher: IEEE Comput. Soc
Year: 2005
Weight: 258 KB
Volume: 0
Category: Article
ISBN-13: 9780769524641
DOI: 10.1109/dftvs.2005.61

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