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[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Fault-tolerant CAM architectures: a design framework

✍ Scribed by Salice, F.; Sami, M.G.; Stefanelli, R.

Book ID: 118171406
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 426 KB
Volume: 0
Category: Article
ISBN-13: 9780769518312
DOI: 10.1109/dftvs.2002.1173520

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