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[IEEE Comput. Soc 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. DFT 2002 - Vancouver, BC, Canada (6-8 Nov. 2002)] 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. - Fault list compaction through static timing analysis for efficient fault injection experiments

✍ Scribed by Reorda, M.S.; Violante, M.

Book ID: 118140441
Publisher: IEEE Comput. Soc
Year: 2002
Tongue: English
Weight: 267 KB
Volume: 0
Category: Article
ISBN-13: 9780769518312
DOI: 10.1109/dftvs.2002.1173523

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