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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Compression of VLSI test data by arithmetic coding

✍ Scribed by Hashempour, H.; Lombardi, F.

Book ID: 118055308
Publisher: IEEE
Year: 2004
Weight: 326 KB
Volume: 0
Category: Article
ISBN-13: 9780769522418
DOI: 10.1109/dftvs.2004.1347835

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