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[IEEE 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Cannes, France (10-13 Oct. 2004)] 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. - Online testable reversible logic circuit design using NAND blocks

✍ Scribed by Vasudevan, D.P.; Lala, P.K.; Parkerson, J.P.

Book ID: 121878194
Publisher: IEEE
Year: 2004
Weight: 339 KB
Category: Article
ISBN-13: 9780769522418
DOI: 10.1109/DFTVS.2004.1347856

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📜 SIMILAR VOLUMES

[IEEE 19th IEEE International Symposium

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